Cardinal时钟振荡器稳定性

Measuring Clock Oscillator Frequency Stability
测量时钟振荡器频率稳定性

Oscillators exhibit a number of frequency/period instabilities. Manufacturers generally specify their oscillators in terms of short term, long term, and environmental frequency stability.
振荡器表现出许多频率/周期不稳定性。制造商通常会指定他们的石英晶体振荡器在短期内长期、长期和环境频率稳定性

Environmental stability reflects the effects of temperature, vibration, power supply variations, and other environmental factors on an oscillator’s output frequency or phase. Figure 1 is an example of the stability of a clock oscillator during warmup from a cold start. The actually oscillator output is shown in Trace 2. The lower trace (trace B) is the trend of mean internal temperature (1mV = 1° C). It shows that during startup the internal temperature increases by about 8° C over a period of 2000 seconds. During that time the average change in the oscillators period is about ±25 ps. This is read in trace C which contains the smoothed measurement of the trend of time interval error at level (tie@lv) . Time interval error at level measures the time difference of an oscillator’s measured period from an ideal period. Trace A, the trend of tie @lv, is overlaid on the smoothed trace. It shows a peak to peak variation of slightly more than ±100 ps. Temperature variation has little effect on this oscillator.

环境稳定性反映了温度、振动、电源变化和其他环境因素对振荡器输出频率或相位的影响。图1是时钟振荡器在冷启动预热期间的稳定性示例。实际振荡器输出如图2所示。较低的轨迹（轨迹B）是平均内部温度（1mV=1°C）的趋势。它表明，在启动过程中，内部温度在2000秒内增加了约8°C。在这段时间内，石英晶体振荡器周期的平均变化约为±25 ps。这在轨迹C中读取，轨迹C包含对水平上时间间隔误差趋势的平滑测量(tie@lv)。电平上的时间间隔误差测量振荡器的测量周期与理想周期的时间差。轨迹A（tie@lv的趋势）覆盖在平滑轨迹上。它显示出略高于±100 ps的峰间变化。温度变化对这个振荡器几乎没有影响

Long term stability, illustrated in figure 2, involves a gradual drift in oscillator timing. Long term stability generally includes oscillator aging but excludes environmentally induced drift. Aging, in crystal oscillator is caused by a variety of electromechanical mechanisms. Long term stability is usually expressed in parts per million or ppm. A typical specification of 10 ppm means that over a 1 ms interval the clock period can change by 10 ns: △t=1ms*(10/1,000,000) =10 ns
长期稳定性，如所示图2涉及一个逐渐漂移振荡器定时。长期的稳定性通常包括振荡器老化，但不包括环境引起的漂移。老化，在晶体振荡器中引起通过各种机电机制。长期稳定性通常用份/来表示百万或百万分之一。10 ppm的典型规格意味着在1毫秒的时间间隔内，时钟周期可以变化10 ns:△t=1ms*(10/1,000,000) =10ns

Short term stability is a function of noise signals within the oscillator and represents a phase modulation of the oscillator output. Short term stability can be specified in the time domain as jitter. The greatest drawback to this method of specifying short term stability is that it is dependent of the measurement interval. The longer the measurement observation time the greater the peak to peak jitter magnitude. Figure 3 shows a typical jitter measurement of a 400 MHz Surface Acoustic Wave (SAW) oscillator. The mean or average period is 2.4999 ns with an rms jitter (sigma) of 7 ps and a peak to peak jitter (range) of 35 ps. Note that the manufacturer of this oscillator specifies that peak to peak jitter for a measurement duration of 1000 cycles.
短期稳定性是一个函数振荡器中的噪声信号，代表一个贴片石英晶振相位振荡器输出的调制。短期稳定性可以是在时域中指定为抖动。最大的缺点是这种指定short的方法术语稳定性在于它依赖于测量间隔。测量观察时间越长峰峰值抖动幅度。图3显示了典型的抖动 400 MHz的测量表面声波振荡器。平均值或平均数均方根周期为2.4999 ns 7 ps的抖动(σ)和峰值峰值抖动(范围)为35 ps。请注意，制造商这个振荡器指定了那个峰值为了测量峰值抖动 1000个周期的持续时间。

Many manufacturers minimize the observation time dependency by specifying the oscillator short term stability in terms of the Allan Variance. The Allan Variance uses the frequency difference between adjacent frequency measurements, usually made with a frequency counter, to compute the variance of oscillator output frequency.
许多制造商尽量减少观察时间相关性通过指定振荡器短路根据Allan方差的项稳定性。艾伦方差使用频率差相邻频率之间测量，通常使用一个频率计数器，用来计算振荡器输出的方差频率。

Short term stability can also be specified in the frequency domain as phase noise. Phase noise characterizes the shape of the frequency spectrum of the oscillator. A typical phase noise specification is –100 dbC at 10 kHz offset from the carrier. Phase noise can be measured using a narrowband FFT spectrum analyzer (12-16 bit amplitude resolution) or a dedicated phase noise measurement system.
短期稳定性也可以在频域中指定作为相位噪声。相位噪声表征的形状振荡器的频谱。典型相位噪声 10时的规格为–100 dbC 与载波的kHz偏移。 石英晶振相位噪声可以使用窄带FFT频谱来测量分析器(12-16位振幅分辨率)或专用阶段噪声测量系统。

The greatest strength of the LeCroy jitter and timing analysis package is the ability to study both long term and short term variations in oscillator timing. Long memory and SmartTriggers make it easy to acquire and display this data Specialized jitter measurements combined with the capability to measure and correlate the effects of other parameters such as temperature or supply voltage are ideal for evaluating environmental stability
勒罗伊抖动和时序分析的最大优势包是学习的能力长期和短期振荡器定时的变化。长记忆和智能触发器使采集和显示这种数据变得容易专门抖动测量值与能够测量和关联温度或电源电压等其他参数的影响是评估环境稳定性的理想选择。

原厂编码	品牌	系列	Description描述
CPPC5-A7BP-80.0TS	Cardinal晶振	FIPO™ CPP	OSC XO 80.000MHZ CMOS SMD
CPPC7LZ-A7BR-36.864TS	Cardinal晶振	FIPO™ CPP	OSC XO 36.864MHZ CMOS SMD
CPPLC7LT-BR-100.0TS	Cardinal晶振	FIPO™ CPPL	OSC XO 100.000MHZ CMOS SMD
CPPC7L-B6-64.0TS	Cardinal晶振	FIPO™ CPP	OSC XO 64.000MHZ CMOS SMD
CPPC7LZA7BP-25.0000TS	Cardinal晶振	FIPO™ CPP	OSC XO 25.000MHZ CMOS SMD
CPPC7LZA7BP-3.579540TS	Cardinal晶振	FIPO™ CPP	OSC XO 3.57954MHZ CMOS SMD
CPPC7LZA7BP-3.68640TS	Cardinal晶振	FIPO™ CPP	OSC XO 3.6864MHZ CMOS SMD
CPPC7LZ-A7BP-14.318TS	Cardinal晶振	FIPO™ CPP	OSC XO 14.318MHZ CMOS SMD
CPPC7L-A5BR-66.0TS	Cardinal晶振	FIPO™ CPP	OSC XO 66.000MHZ CMOS SMD
CPPC7L-A5BR-8.192TS	Cardinal晶振	FIPO™ CPP	OSC XO 8.192MHZ CMOS SMD
CPPC7L-B6-40.0TS	Cardinal晶振	FIPO™ CPP	OSC XO 40.000MHZ CMOS SMD
CPPC7-A7BR-180.0TS	Cardinal晶振	FIPO™ CPP	OSC XO 180.000MHZ CMOS SMD
CPPC7L-A7BP-63.0TS	Cardinal晶振	FIPO™ CPP	OSC XO 63.000MHZ CMOS SMD
CPPC7L-A5BR-66.0PD	Cardinal晶振	FIPO™ CPP	OSC XO 66.000MHZ CMOS SMD
CPPC7L-A7BP-11.0592TS	Cardinal晶振	FIPO™ CPP	OSC XO 11.0592MHZ CMOS SMD
CPPC7L-A5B6-11.059TS	Cardinal晶振	FIPO™ CPP	OSC XO 11.0592MHZ CMOS SMD
CPPC7L-A7BR-30.0TS	Cardinal晶振	FIPO™ CPP	OSC XO 30.000MHZ CMOS SMD
CPPC7L-A7B6-130.0TS	Cardinal晶振	FIPO™ CPP	OSC XO 130.000MHZ CMOS SMD
CPPC7L-A5B6-18.432TS	Cardinal晶振	FIPO™ CPP	OSC XO 18.432MHZ CMOS SMD
CPPC7L-A5B6-22.1184TS	Cardinal晶振	FIPO™ CPP	OSC XO 22.1184MHZ CMOS SMD
CPPC7-A7BP-28.0TS	Cardinal晶振	FIPO™ CPP	OSC XO 28.000MHZ CMOS SMD
CPPC7L-A7B6-16.0PD	Cardinal晶振	FIPO™ CPP	OSC XO 16.000MHZ CMOS SMD
CPPC7L-A5BP-100.0PD	Cardinal晶振	FIPO™ CPP	OSC XO 100.000MHZ CMOS SMD
CPPC7L-A5BP-100.0TS	Cardinal晶振	FIPO™ CPP	OSC XO 100.000MHZ CMOS SMD
CPPC7L-A5BP-2.048TS	Cardinal晶振	FIPO™ CPP	OSC XO 2.048MHZ CMOS SMD
CPPC7L-A5BP-25.0TS	Cardinal晶振	FIPO™ CPP	OSC XO 25.000MHZ CMOS SMD
CPPC7L-A7BP-12.0TS	Cardinal晶振	FIPO™ CPP	OSC XO 12.000MHZ CMOS SMD
CPPC7L-A5BP-25.1658TS	Cardinal晶振	FIPO™ CPP	OSC XO 25.1658MHZ CMOS SMD
CPPC7L-A5BP-31.25TS	Cardinal晶振	FIPO™ CPP	OSC XO 31.25MHZ CMOS SMD
CPPC7L-A7BR-32.768TS	Cardinal晶振	FIPO™ CPP	OSC XO 32.768MHZ CMOS SMD
CPPC7-A7BR-200.0TS	进口晶振	FIPO™ CPP	OSC XO 200.000MHZ CMOS SMD
CPPC7L-A5BP-60.0TS	Cardinal晶振	FIPO™ CPP	OSC XO 60.000MHZ CMOS SMD
CPPC7L-A5BP-62.5TS	Cardinal晶振	FIPO™ CPP	OSC XO 62.50MHZ CMOS SMD
CPPC7L-A7BP-125.0TS	Cardinal晶振	FIPO™ CPP	OSC XO 125.000MHZ CMOS SMD
CPPC7L-A5BP-66.0TS	Cardinal晶振	FIPO™ CPP	OSC XO 66.000MHZ CMOS SMD
CPPC7L-A5BR-16.896TS	Cardinal晶振	FIPO™ CPP	OSC XO 16.896MHZ CMOS SMD
CPPC7L-A7BR-33.3333TS	Cardinal晶振	FIPO™ CPP	OSC XO 33.3333MHZ CMOS SMD
CPPC7L-A5BR-24.4196TS	Cardinal晶振	FIPO™ CPP	OSC XO 24.4196MHZ CMOS SMD
CPPC7-A7BR-210.0TS	Cardinal晶振	FIPO™ CPP	OSC XO 210.000MHZ CMOS SMD
CPPC7L-A5BR-24.6945TS	Cardinal晶振	FIPO™ CPP	OSC XO 24.6945MHZ CMOS SMD
CPPC7L-A5BR-25.0TS	Cardinal晶振	FIPO™ CPP	OSC XO 25.000MHZ CMOS SMD
CPPC7L-A7BR-40.0TS	Cardinal晶振	FIPO™ CPP	OSC XO 40.000MHZ CMOS SMD
CPPC7L-A7BP-16.0000TS	Cardinal晶振	FIPO™ CPP	OSC XO 16.000MHZ CMOS SMD
CPPC7L-A5BR-34.56TS	Cardinal晶振	FIPO™ CPP	OSC XO 34.56MHZ CMOS SMD
CPPC7L-A5BR-40.0TS	Cardinal晶振	FIPO™ CPP	OSC XO 40.000MHZ CMOS SMD
CPPC7L-A5BR-62.208TS	Cardinal晶振	FIPO™ CPP	OSC XO 62.208MHZ CMOS SMD
CPPC7L-A7BR-10.368TS	Cardinal晶振	FIPO™ CPP	OSC XO 10.368MHZ CMOS SMD
CPPC7L-A7B6-24.0TS	Cardinal晶振	FIPO™ CPP	OSC XO 24.000MHZ CMOS SMD
CPPC7L-A7BP-100.0TS	Cardinal晶振	FIPO™ CPP	OSC XO 100.000MHZ CMOS SMD
CPPC7L-A7BP-62.5TS	Cardinal晶振	FIPO™ CPP	OSC XO 62.50MHZ CMOS SMD
CPPC7L-A7BR-28.63636TS	Cardinal晶振	FIPO™ CPP	OSC XO 28.63636MHZ CMOS SMD
CPPC7-A7BP-25.175TS	Cardinal晶振	FIPO™ CPP	OSC XO 25.175MHZ CMOS SMD
CPPC7L-A7BR-32.0TS	Cardinal晶振	FIPO™ CPP	OSC XO 32.000MHZ CMOS SMD
CPPC7-A7BR-20.0TS	Cardinal晶振	FIPO™ CPP	OSC XO 20.000MHZ CMOS SMD
CPPC7L-A7BP-78.0TS	Cardinal晶振	FIPO™ CPP	OSC XO 78.000MHZ CMOS SMD
CPPC7L-A7B6-16.384TS	Cardinal晶振	FIPO™ CPP	OSC XO 16.384MHZ CMOS SMD
CPPC7-A7BP-29.4912TS	Cardinal晶振	FIPO™ CPP	OSC XO 29.4912MHZ CMOS SMD
CPPC7L-A7BP-8.0TS	Cardinal晶振	FIPO™ CPP	OSC XO 8.000MHZ CMOS SMD
CPPC7-A7BP-3.6864PD	Cardinal晶振	FIPO™ CPP	OSC XO 3.6864MHZ CMOS SMD
CPPC7L-A7B6-22.0000TS	Cardinal晶振	FIPO™ CPP	OSC XO 22.000MHZ CMOS SMD
CPPC7L-A7BP-81.92TS	Cardinal晶振	FIPO™ CPP	OSC XO 81.92MHZ CMOS SMD
CPPC7-A7BR-211.0TS	Cardinal晶振	FIPO™ CPP	OSC XO 211.000MHZ CMOS SMD
CPPC7L-A7BR-40.32TS	Cardinal晶振	FIPO™ CPP	OSC XO 40.32MHZ CMOS SMD
CPPC7-A7BP-30.0TS	Cardinal晶振	FIPO™ CPP	OSC XO 30.000MHZ CMOS SMD
CPPC7-A7BR-28.0TS	Cardinal晶振	FIPO™ CPP	OSC XO 28.000MHZ CMOS SMD
CPPC7L-A7BR-40.5PD	Cardinal晶振	FIPO™ CPP	OSC XO 40.50MHZ CMOS SMD
CPPC7L-A7BP-2.0TS	Cardinal晶振	FIPO™ CPP	OSC XO 2.000MHZ CMOS SMD
CPPC7-A7BP-32.0TS	Cardinal晶振	FIPO™ CPP	OSC XO 32.000MHZ CMOS SMD
CPPC7-A7BP-4.0TS	Cardinal晶振	FIPO™ CPP	OSC XO 4.000MHZ CMOS SMD
CPPC7L-A7BR-50.0TS	Cardinal晶振	FIPO™ CPP	OSC XO 50.000MHZ CMOS SMD
CPPC7L-B6-14.318TS	Cardinal晶振	FIPO™ CPP	OSC XO 14.318MHZ CMOS SMD
CPPC7L-B6-16.384TS	Cardinal晶振	FIPO™ CPP	OSC XO 16.384MHZ CMOS SMD
CPPC7L-A7BP-49.152TS	Cardinal晶振	FIPO™ CPP	OSC XO 49.152MHZ CMOS SMD
CPPC7L-A7BP-50.0TS	Cardinal晶振	FIPO™ CPP	OSC XO 50.000MHZ CMOS SMD
CPPC7-A7BR-30.0TS	Cardinal晶振	FIPO™ CPP	OSC XO 30.000MHZ CMOS SMD

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